Skip to main content
School Logo Link
MENU
MENU
About
About FICS Research
Contact Us
Faculty
Students
Research
Research Areas
Portfolio I
Portfolio II
FaaS
T-PAINE
Counterfeit IC
SURF
Trust-Hub
Cad4 Security
PRISM
Academics
Cyber Security Courses
Certificate Program
CyberCorps NSF SFS
GAANN Fellowship
Scholarships
Facilities
Nanoscale Imaging
IC Testing and Characterization
Hardware Security Assessment
Burn-in Test and Reliability Analyses
Medical Device Testing
CPSec Lab
Outreach
TAME Forum
FICS Research Conference
WISE (Women in Hardware and Systems Security)
ADI Distinguished Speaker Series
UF Student Infosec Team
Academic Outreach
Sponsors
Media
Newsletter
In The Press
Home
Research
Counterfeit IC
PLX Technology IC Defects
[envira-gallery id=”19803″]
Download the full Gallery
Download
Search Submit
