Facilities
FICS Research SCAN Lab
The FICS Research SeCurity and AssuraNce (SCAN) Lab at the University of Florida contains state-of-the-art, multi-million dollar instruments that provide the capability to perform cutting-edge research on a variety of current hardware and software security issues and topics, from device-to-system assurance, security, and integrity analysis. For any questions about SCAN Lab, please contact Lab Director Domenic Forte (dforte@ece.ufl.edu), Assistant Lab Director Navid Asadi (nasadi@ece.ufl.edu) or Lab Technician Nitin Varshney (nitinvarshney1@ufl.edu).
The FICS SCAN Lab is made possible by generous gifts from and collaborations with:
The following are areas in which the SCAN Lab is currently supporting advancements in research:
 | IC Testing and Characterization |
|---|---|
 | Nanoscale Imaging Capabilities (X-ray, SEM, light microscopy, …) |
 | Burn-in Test and Reliability Analyses |
 | Hardware Security and Electrical Test Assessment Capabilities |
 | Medical Device Test Capability |
| Computing Resources | |
| Cyber-Physical Systems (CPS) Testbeds |