Skip to main content
FICS Research
MENU
MENU
About
About FICS Research
Contact Us
Faculty
Students
Research
Research Areas
PRISM
Portfolio I
Portfolio II
T-PAINE
Counterfeit IC
SURF
Trust-Hub
Cad4 Security
Academics
Cyber Security Courses
Certificate Program
Scholarships
Facilities
Nanoscale Imaging
IC Testing and Characterization
Hardware Security Assessment
Burn-in Test and Reliability Analyses
Medical Device Testing
CPSec Lab
Outreach
FICS Research Conference
FICS Research Summit
2022 Trusted and Assured Microelectronics (TAME) Forum
WISE (Women in Hardware and Systems Security)
ADI Distinguished Speaker Series
UF Student Infosec Team
Academic Outreach
Sponsors
Media
Newsletter
In The Press
Home
Research
Counterfeit IC
Fairchild IC Defects
Fairchild IC Defects
Download the full Gallery
Download
Search Submit
