Skip to main content
University of Florida
FICS Research
FICS Research
About
About FICS Research
Contact Us
Diversity Statement
Faculty
Students
Research
Research Areas
Portfolio I
Portfolio II
FaaS
T-PAINE
Counterfeit IC
SURF
Trust-Hub
Cad4 Security
PRISM
Academics
Cyber Security Courses
Certificate Program
CyberCorps NSF SFS
GAANN Fellowship
Scholarships
Facilities
Nanoscale Imaging
IC Testing and Characterization
Hardware Security Assessment
Burn-in Test and Reliability Analyses
Medical Device Testing
CPSec Lab
Outreach
FICS Research Summit
TAME Forum
FICS Research Conference
WISE (Women in Hardware and Systems Security)
ADI Distinguished Speaker Series
UF Student Infosec Team
Academic Outreach
Sponsors
Media
Newsletter
In The Press
Herbert Wertheim College of Engineering
Search
Submit
Search
Search
Submit
Search
FICS Research
Home
Research
Counterfeit IC
Atmel IC Defects
Atmel IC Defects
Pages
Cad4 Security
Trust-Hub
SURF
T-PAINE
Counterfeit IC
Xilinx IC Defects
Tundra Semiconductor IC Defects
Texas Instruments IC Defects
STMicroelectronics IC Defects
PLX Technology IC Defects
Onsemi IC Defects
Nexperia IC Defects
National Semiconductor IC Defects
MT IC Defects
Micron IC Defects
Lattice IC Defects
Intel IC Defects
IDT IC Defects
ICS IC Defects
Fairchild IC Defects
Broadcom IC Defects
Atmel IC Defects
Analog Devices IC Defects
AMD IC Defects
FaaS
Portfolio II
Portfolio I
Research Areas
Atmel IC Defects
Download the full Gallery
Download
