ECE Assistant Professor Navid Asadi has received an NSF CAREER Award in support of his project, “Backside Protection Against Contactless Optical Attacks on Integrated Circuits in Advanced Technology Nodes.” Dr. Asadi also serves as co-director of the SCAN Lab at the Florida Institute for Cybersecurity (FICS) Research and associate director of the Micro-Electronics Security Training (MEST) Center. The project works to assess the security vulnerabilities of modern Integrated Circuits (ICs) against “contactless optical attacks from backside” and to provide a framework to develop proper countermeasures. The project will leverage access to state-of-the-art equipment and expertise available at FICS Research’s SCAN Lab, home to more than $10M of advanced imaging equipment for electronics physical assurance.

Read the full feature here: https://news.ece.ufl.edu/2022/06/03/asadi-receives-nsf-career-award