Mission Possible: UF Technology Spots Microchip Hacks


“…Researchers in the University of Florida’s Florida Institute for Cybersecurity Research (FICS) have developed a semiautomated system that could have identified in seconds the malicious chips….[sic] The FICS system uses optical scans, microscopy, X-ray tomography, and artificial intelligence to compare a printed circuit board and its chips and components with the intended design. The system takes high-resolution images of the front and back of the circuit board, the machine learning algorithms go through the images, tracing the interconnects and identifying the components. X-ray tomography imagery is then applied to examine interconnects and components buried within the circuit board…,” Read More.

Moore, S, (2018, October 4) IEEE Spectrum: This Tech Would Have Spotted the Secret Chinese Chip in Seconds