FICS Research Faculty, Forte and Maghari, invent new “Universal Testing Technique”
An article recently published in the Academic Times profiled exciting new technology invented by researchers at the Florida Institute for Cybersecurity (FICS) Research which promises a new way to detect recycled (previously used) and counterfeit electronic parts, especially chips. The technology created by ECE Associate Professor Domenic Forte and ECE Associate Professor Nima Maghari makes supply chains more secure, protects consumer safety and runs at almost zero cost. Compared to current methods of detecting counterfeit hardware (chips, power supplies, electronics components, etc.), the proposed “universal testing technique” can be used on virtually all chips produced by all vendors and can be further improved by applying artificial intelligence algorithms in order to automate detection.