Hardware Security and Electrical Test Assessment Capabilities

Electrical testing equipment housed in the FICS Research SCAN Lab includes mixed signal oscilloscopes, digital oscilloscopes, logic analyzers, spectrum analyzers, arbitrary waveform/function generators, power supplies, digital multimeters and Summit 12000B semi-automated probe station. The hardware security applications and research supported by this equipment include, but not limited to, PCB-level probing, side-channel analysis, analysis of physical unclonable function (PUF) reliability against power supply variance, and Nuclear Magnetic Resonance (NMR) spectroscopy analysis.