T-PAINE will cover all aspects of physical assurance and inspections using our advanced microscopy capabilities at SCAN lab in FICS Research Institute which is unique in the nation and even in the world. Students will learn advanced failure analysis tools and how they can be used for physical assurance and inspection of electronic systems and components. T-PAINE shall leverage the SCAN lab facilities and provide an environment for hands-on implementation, training, and evaluation.This new training program is offered exclusively at the University of Florida and prepares undergraduates for careers in Department of Defense Agencies.
This program will include invited talks from government agencies, industry, etc.
T-PAINE, Summer Offer Includes:
9 week summer internship at the University of Florida (June 1 to August 1, 2020) on Physical Assurance and Inspection of Electronics (PAINE)
T-PAINE students will have the opportunity to learn instruments and machines including; Bruker Skyscan 2211 X ray Micro CT, TESCAN FERA and LYRA SEM FIB systems, ZEISS ORION Nanofab, Cascade Summit micro probe station, HAMAMATSU Phemos 1000.